Showing results: 316 - 330 of 514 items found.
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Yelo Ltd.
A test fixture or test jig is the component containing the bed of nails used for testing the PCB or assembled product. It is powered and controlled by the Yelo Testpoint system which has test cards capable of providing multiple test conditions. This system also controls the probes used in the bed of nails, and relays test information back to the Testpoint system to be analysed.
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HBM, Inc
With 25 MS/s, 100 MS/s or 250 MS/s the high speed input cards are suitable for the acquisition of ultra fast, accurate and high resolution transient signals in high speed mechanical tests or electrical/electronic environments. 14-/15-/16-bit resolution; dynamic resolution increase. available 5/18
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8091 -
ELMA Electronic, Inc.
The PMC-to-PCI Adapter for Test is an active extender that accommodates live insertion of one PCI Mezzanine Card (PMC) for performance analysis and testing in a PCI bus environment.
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AutoSIR2™ -
Gen3 Systems Limited
One AutoSIR chassis can hold between 1 to 16 measurement cards and can monitor up to 256 x 2-point test patterns or 78 x 5-point test patterns, or 32 x 9-point test patterns at selectable intervals from minutes to days. Each channel is current limited (1 M Ω), ensuring that dendrites are preserved for failure analysis. The frequent monitoring capability provides a full picture of the electrochemical reactions taking place on a circuit assembly, and provides early trend analysis enabling tests to be curtailed, thus saving considerable test time and money.
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ELMA Electronic, Inc.
Elma implements quickly and easily scalable, robust 19'' subracks, card cages or rackmount chassis for the use in just about any industry or environment: Industrial automation, test & measurement, transportation, energy, defense, communications and medical. The products of Elma Electronic support standards such as IEC, IEEE or AdvancedTCA.
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TFMC900 -
TEWS Technologies GmbH
The TFMC900 is an FMC (FPGA Mezzanine Card) Mezzanine Module designed to test ANSI/VITA 57.1 FMC Carriers during development or series production. Additionally, it offers the possibility to realise various I/O solutions for connected FMC Carriers. Interconnection of the High Pin Count FMC Connector signals can be verified by JTAG and by functional tests. A loop-back of the 10 multi-gigabit transceiver interfaces allows interconnection checks for the high-speed serial interfaces.
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VC20E Lab -
Celadon
*20 millimeter ceramic probe card*Optimized for DC parametric test, modeling and characterization, and single site WLR*Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor*Effective operating temperature range from -65° to 200° C*Leakage as low as 5fA/V. If you require faster settling time, click here*Can be configured with up to 48 probes
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NEOSEM TECHNOLOGY INC
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies. Up to 64 Blades populated in one test head can test over 2000 DUTs in parallel. Neosem Technology’s high parallel DUT count architecture, combined with low capital cost, provides the absolute lowest HVM cost of test.
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Valiant 153M -
Safran Federal Systems
Valiant 153M is a GB-GRAM/GB-GRAM-M (GB-GRAM/M) interface card that allows the simultaneous operation and testing of a commercial- off-the-shelf (COTS) receiver and a GB-GRAM/M. Both receivers are powered and communicate using a single USB mini cable. By integrating a COTS receiver onto the Valiant 153M, users can perform cross-checks to determine if the military receiver is connected and communicating data properly. Both receivers communicate via the onboard USB mini or RS-232 serial connectors. The Valiant test fixture was designed to be nearly the same size as the GB-GRAM/M type I card.
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PCI-7432/7433/7434 -
ADLINK Technology Inc.
ADLINK's cPCI/PCI-743X series cards are 64-CH high-density digital input and/or output cards that provide a robust 2,500 V isolation protection and are suitable for most industrial applications. The wide input range of the cPCI/PCI-7432 and cPCI/PCI-7433 makes it easy to sense the status of external devices. There are several options for PCI-743X series, such as normal version with input range from 0 to 24 V, as well as HIR version with high input range from 0 to 50 V. The PCI- 7433ALC is specifically designed for AC power test system.
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Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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GX3702 -
Marvin Test Solutions, Inc.
The GX3702 is a user configurable, FPGA-based, 3U PXI card which offers 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features over 45,000 logic elements and 1.836 Kb of memory. The GX3702 is supplied with an integral expansion board providing access to the FPGA's 160 I/Os and is pin for pin compatible with the NI PXI 7813R and 7811R FPGA cards . Alternatively, users can design their own custom expansion cards for specific applications - eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system. The design of the FPGA is done by using Altera's free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded into the FPGA directly or via an on-board EEPROM.
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IIB-3910-VME-2C -
Western Avionics Ltd.
The IIB-3910-VME-2C is a 6U single VME slot intelligent interface card providing complete STANAG 3838 andSTANAG 3910 test, simulation and bus analysis capability, for two 3838 dual redundant and two 3910 buses, which support optical dual redundant and electrical single redundant 3910 protocols.
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Direct Dock -
SV Probe, Inc.
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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9U VME430 6023 -
W-IE-NE-R, Plein & Baus GmbH
The WIENER VME 6023 crate series is the newest generation CERN VME430 compliant VME crates for large size 9Ux400mm cards. Designed for applications in nuclear and high-energy physics data acquisition, beam line control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.